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Teodor P. Gotszalk, Pawel Janus, Andrzej Marendziak, Roman F. Szeloch: Keywords: uncertainty of measurement, atomic force microscopy (AFM) Abstract
Roman F. Szeloch, Teodor P. Gotszalk, Pawel Janus: Keywords: scanning thermal microscopy, thermal characterization, AFM: Abstract: After a brief survey of several applications of scanning ...
Krystyna Golaszewska 2, Eliana Kaminska 2, Anna Piotrowska 2, Renata Kruszka 2, Andrian V. Kuchuk 2, Ewa Papis 2, Roman Szeloch 1, Pawel Janus 1, Teodor Gotszalk 1, Adam ...
... Dependence: An Estimation Framework for Daily Realized Volatility (coauthor: Marcelo C. Medeiros) Shinsuke Ikeda, Boston University Multivariate Two Scale Realized Kernels Pawel Janus ...
Janus, Pawel Janus, Thorsten M Janz, Norbert JAOUL-GRAMMARE, Magali Jappelli, Tullio Jaramillo, Fernando Jaramillo G., Patricio Jaramillo-Gutiérrez, Ainhoa
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