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Comparative study of superthin TiN x layer by XPS and low energy SIMS; Metastable Phase and Structural Transitions of Superthin Ti/Si and TiN/SiN Multilayers
Metastable Phase and Structural Transitions of Superthin Ti/Si and TiN/SiN Multilayers: Jerzy Ciosek 1, Sylwia Burdyńska 2, Artur Prokopiuk 2, Roman Major 3, Bogusław Major 3 ...
Acknowledgment - The authors would like to thank dr. Jerzy Ciosek of the Institute of Electron Technology in Warsaw for preparing the dichroic mirrors used in our work.
... one holographic shearing interferometer. !5 Paper #: 3320-30 Interference coatings on the plane-parallel plate in laser applications, pp.244-249 Author(s): Jerzy Ciosek ...
... instrument manufacturers.!17 Paper #: 3820-13 Interference filter with polarization-variable half-width at normal incidence, pp.111-114 Author(s): Jerzy Ciosek ...
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